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首頁 產(chǎn)品中心 IC測試座,老化測試座(IC
Test and Burn-In Socket)
IC測試座,老化測試座/IC
test and Burn-In Socket |
菱美電子專業(yè)代理及經(jīng)銷各式IC測試座,IC測試夾具,老化測試座,高頻測試座,品牌包括:ENPLAS,YAMAICHI,
WELLS-CTI,E-TEC,3M TEXTOOL,TI,PLASTRONICS,ADVANCED INTERCONNECTIONS
球型出腳BGA測試插座,MERITEC貼片SOP測試插座等.測試座封裝含概:BGA,,CSP,PGA,QFN,MLF,LGA,QFP,TSOP,SOP,PLCC,SOJ,TO等,并且可以根據(jù)客戶需求定制BGA/QFN測試座.無論您是設計,測試,燒錄,還是老化,生產(chǎn),必有一款滿足您的要求.


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BGA
Socket / BGA測試座/老化座/ 燒寫座
LGA Socket / LGA測試座 / CGA
Socket / CGA測試座 |
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菱美電子提供最全的BGA/LGA/CGA測試/老化插座產(chǎn)品,依托歐洲領先的BGA測試產(chǎn)品生產(chǎn)工藝,為客戶提供優(yōu)質(zhì)的BGA/CSP/LGA測試插座產(chǎn)品,并可根據(jù)客戶芯片的規(guī)格,提供定制化的服務.BGA測試插座分球形出腳(SMT)和針形出腳兩種設計.球形出腳的BGA插座系統(tǒng)主要適用于芯片的測試及開發(fā)等.該插座系統(tǒng)的特點是不用在PCB板上開孔,BGA插座的焊接方法和BGA芯片的焊接方法完全一樣.同時如果在客戶的目標板上BGA
Pad旁邊如果已經(jīng)存在一些貼片器件而影響到BGA插座的安裝,我們亦提供BGA插座的升高設計以便滿足客戶的實際要求.部分BGA插座貨期更短至2-3周。并可根據(jù)客戶的BGA器件出腳,定制合適的BGA插座(Available
for any chip size and grid pattern)。
老化插座的工作溫度一般為:-55°C~150
°C
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IC
Test and Burn-In Socket - LingMei
Electronic |
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Any
package style: ceramic & plastic BGA, CSP,
LGA, CGA, PSGA, MLF/QFN,QFP, SOIC, and other
standard packages, custom packages or bare
die
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Same footprint as BGA device.
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-1dB bandwidth: >14GHz for
compression style; 3GHz for SMD style
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Inductance: less than 2nH
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Hundreds of footprints available from 1.5mm
down to 0.50mm pitch.
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IC
Test and Burn-In Socket - LingMei
Electronic |
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QFN
Socket \ MLF socket |
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Available in .40, .50, .65, .80 and 1.00 mm
pitches
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Custom pitches down to .30 mm
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Lidded and Open Top Sockets for 3 mm - 10 mm
packages
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Hundreds of footprints available from 1.5mm
down to 0.75mm pitch.
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Lidded Sockets for 10 - 16 mm packages
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Center ground pin standard for all sockets
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Optional copper heat slug available for high
wattage devices
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Sockets for over 80 different JEDEC standard
footprints
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IC Test and Burn-In Socket - LingMei Electronic |
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PGA
Socket / PGA測試老化測試座 |
菱美電子提供最全的PGA測試/老化插座,產(chǎn)品分為2.54mm及1.27mm兩重規(guī)格,品牌包括:3M™ Textool™
,E-TEC,WELLS-CTI,Advanced Interconnections及YAMAICHI等.亦可定制PGA測試及老化插座(無開模費用).
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IC
Test and Burn-In Socket - LingMei Electronic |
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QFP
Socket / QFP老化測試座 |
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Pin counts 32 to 304
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Pitch sizes 0.4, 0.5, 0.635, 0.65, 0.8 and 1.0mm
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High reliability, durability and temperature
range
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Custom made also available for high pin
count and fine
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IC
Test and Burn-In Socket - LingMei
Electronic |
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SOP
Socket / SOP老化測試座 |
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Pin Count:16
to 88
Pitch:0.5
to 1.27
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IC
Test and Burn-In Socket - LingMei
Electronic |
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TSOP
Socket / TSOP老化測試座 |
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IC
Test and Burn-In Socket - LingMei
Electronic |
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SOP
Surface Mount Socket |
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980020-48-01,980020-48-02
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IC
Test and Burn-In Socket - LingMei
Electronic |
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DIP
Socket / DIP老化座 |
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IC
Test and Burn-In Socket - LingMei
Electronic |
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蝶形激光器插座 /
Flat Package
socekt |
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IC
Test and Burn-In Socket - LingMei Electronic |
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PLCC
Socket / PLCC老化測試座 |
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Test and Burn-In Socket - LingMei Electronic |
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SOT
Socket/晶體管測試座/電源模塊測試座 |
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IC
Test and Burn-In Socket - LingMei
Electronic |
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TO
Socket / TO老化座 |
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IC
Test and Burn-In Socket - LingMei
Electronic |
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